Spherical near-field scanning at the Technical University of Denmark

Technical University of Denmark DTU , Department of Chemistry Annual Report 2010 Technical University of Denmark

Double -Step -Scanning Technique for Spherical Near-Field Antenna Measurements

Probe-corrected spherical near-field antenna measurements with an arbitrary probe set certain requirements on an applicable scanning technique. The computational complexity of the general high-order probe correction technique for an arbitrary probe, that is based on the scanning, is , where is proportional to the radius of the antenna under test (AUT) minimum sphere in wavelengths. With the pre...

the relationship between multiple intelligences and english proficiency of efl learners at payame noor university

این پژوهش برای بررسی پیوند احتمالی میان هوش های چندگانه – پیشنهاد شد? هاوارد گاردنر، 1983– (هم به گونه یکپارچه و هم به گونه بند بند) از یک سو و توانش انگلیسی دانشجویان ایرانی دانشگاه پیام نور در رشته زبان انگلیسی از سوی دیگر انجام گرفت. برای این کار، تافلpbt و پرسش نامه هوش های چندگانه میان 102 دانشجو در دانشگاه پیام نور شهریار پخش شد. نتایج بررسی داده ها نشان می دهد که در اندازه معنا داری 5 در...

A Nonredundant Near-Field to Far-Field Transformation with Spherical Spiral Scanning for Nonspherical Antennas

A fast and accurate near-field – far-field transformation technique with spherical spiral scanning tailored for nonspherical antennas, i.e., radiating systems with two dimensions very different from the third one, is developed in this paper. To this end, an antenna with one or two predominant dimensions (e.g., base station antennas and reflectarrays) is no longer considered as enclosed in a sph...

An overview of scanning near-field optical microscopy in characterization of nano-materials

Scanning Near-Field Optical Microscopy (SNOM) is a member of scanning probe microscopes (SPMs) family which enables nanostructure investigation of the surfaces on a wide range of materials. In fact, SNOM combines the SPM technology to the optical microscopy and in this way provide a powerful tool to study nano-structures with very high spatial resolution. In this paper, a qualified overview of ...